Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices

Soft Error Reliability Using Virtual Platforms: Early Evaluation of Multicore Systems

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Protecting Chips Against Hold Time Violations Due to Variability

A Crash Course on Crises: Macroeconomic Concepts for Run-Ups, Collapses, and Recoveries