Defects-Recognition, Imaging and Physics in Semiconductors XIV
Hiroshi Yamada-Kaneta · Akira Sakai
Jul 2012 · Trans Tech Publications Ltd
Ebook
324
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About this ebook
This volume documents the latest understanding of many topics of current interest in the science and technology of defects in semiconductors. The investigation of defects in semiconductors is a little different to that in other fields of materials science: in order to observe defects in semiconductors and elucidate their physical nature, a very wide range of tools and techniques has been introduced or created; thanks to the inventive ideas of the researchers. This work clearly reflects the lively state of defect investigation in semiconductors.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
Volume is indexed by Thomson Reuters CPCI-S (WoS).
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