X-Ray Diffraction Studies on the Deformation and Fracture of Solids
About this ebook
Part two is devoted to the application of X–ray diffraction methods for various engineering purposes, the residual stress and half-value breadth (the full width at half the maximum) of the diffraction profiles being the two main X–ray parameters utilized in those applications. Chapters are included on X–ray fractography, a powerful technique for failure analysis, which is applied to the brittle fracture of ceramics and to the fatigue fracture of steels under various service conditions.
About the author
Kazuyoshi Tanaka received a doctorate of Engineering degree from Kyoto University in 1978 under the guidance of late Professor Kenichi Fukui who was a co-laureate of Nobel Prize in chemistry in 1981 with Professor Roald Hoffmann in Cornell University. A postdoctoral fellow of JSPS (1978-1979) and had joined in a US company (Energy Conversion Devices, Inc. in Michigan) from 1979 until 1981. He returned to Faculty of Engineering, Kyoto University in 1981 as a Research Associate (1981-1988), and then was promoted to Associate Professor (1988-1996) and Professor in the Department of Molecular Engineering, Graduate School of Engineering, Kyoto University from 1996. Tananka was a leader of the CREST team, JST, from 2002 to 2007 sponsored by the Ministry of Education of Japan, with the research theme of “Nanoelectronic-Device Fabrication Based on the Fine Molecular Design.”
