Metal Impurities in Silicon-Device Fabrication
Klaus Graff
märts 2013 · Springer Series in Materials Science 24. raamat · Springer Science & Business Media
E-raamat
216
lehekülge
reportHinnangud ja arvustused pole kinnitatud. Lisateave
Teave selle e-raamatu kohta
Metal Impurities in Silicon-Device Fabrication treats the transition-metal impurities generated during silicon sample and device fabrication. The different mechanisms responsible for contamination are discussed, and a survey given of their impact on device performance. The specific properties of main and rare impurities in silicon are examined, as well as the detection methods and requirements in modern technology. Finally, impurity gettering is studied along with modern techniques to determine gettering efficiency. In all of these subjects, reliable and up-to-date data are presented. The monograph provides a thorough review of the results of recent scientific investigations, as well as of the relevant data and properties of the various metal impurities in silicon.
Hinnake seda e-raamatut
Andke meile teada, mida te arvate.
Lugemisteave
Nutitelefonid ja tahvelarvutid
Installige rakendus Google Play raamatud Androidile ja iPadile/iPhone'ile. See sünkroonitakse automaatselt teie kontoga ja see võimaldab teil asukohast olenemata lugeda nii võrgus kui ka võrguühenduseta.
Sülearvutid ja arvutid
Google Playst ostetud audioraamatuid saab kuulata arvuti veebibrauseris.
E-lugerid ja muud seadmed
E-tindi seadmetes (nt Kobo e-lugerid) lugemiseks peate faili alla laadima ja selle oma seadmesse üle kandma. Failide toetatud e-lugeritesse teisaldamiseks järgige üksikasjalikke abikeskuse juhiseid.
