Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
A.G. Cullis · John L. Hutchison
Ago 2006 · Springer Proceedings in Physics Kitabu cha 107 · Springer Science & Business Media
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reportUkadiriaji na maoni hayajahakikishwa Pata Maelezo Zaidi
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The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.
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