CompTIA Tech+ CertMike: Prepare. Practice. Pass the Test! Get Certified!: Exam FC0-U71, Edition 2
About this ebook
In the newly updated second edition of CompTIA Tech+ CertMike: Prepare. Practice. Pass the Test! Get Certified! for exam FC0-U71, veteran IT expert and IT educator, Mike Chapple, skips the fluff and dives straight into exactly what you need to ace the entry-level CompTIA Tech+ certification exam on your first try. Filled with the kind of no-nonsense, straight-to-business info you're looking for, the book includes coverage of every relevant exam domain, a full practice exam, and additional multiple choice practice questions with detailed answer explanations.
You'll learn all about IT infrastructure, software development, database use, software installation, network connectivity, and more, as well as how all this valuable knowledge applies to common on-the-job scenarios. You'll also find:
- Complimentary links to audio recordings of the book's Exam Essentials sections to help you review for the test
- Access to additional online study tools
- The information you need to reduce test anxiety and boost your confidence when you walk into the testing room on exam day
Prepare smarter and faster for the Tech+ certification exam with proven strategies created by the bestselling Mike Chapple and his team at CertMike. This book's perfect for people just getting interested in information technology and working towards a more advanced certification, like the CompTIA A+ or Security+ credentials. It's also a can't-miss resource for anyone who wants to learn basic computer literacy skills. Grab your copy today!
About the author
Mike Chapple, PhD, Security+, CySA+, CISSP, is Senior Director for IT Service Delivery at Notre Dame. He oversees information security, data governance, IT architecture, project management, strategic planning, and product management functions. He also teaches courses on information security. He is the author of several bestselling Sybex Study Guides, including the CompTIA Security+ Study Guide.
