Reliability and Statistical Computing: Modeling, Methods and Applications
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The book consists of 18 chapters. It covers (1) modeling in and methods for reliability computing, with chapters dedicated to predicted reliability modeling, optimal maintenance models, and mechanical reliability and safety analysis; (2) statistical computing methods, including machine learning techniques and deep learning approaches for sentiment analysis and recommendation systems; and (3) applications and case studies, such as modeling innovation paths of European firms, aircraft components, bus safety analysis, performance prediction in textile finishing processes, and movie recommendation systems.
Given its scope, the book will appeal to postgraduates, researchers, professors, scientists, and practitioners in a range of fields, including reliability engineering and management, maintenance engineering, quality management, statistics, computer science and engineering, mechanical engineering, business analytics, and data science.
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Dr Hoang Pham is a Distinguished Professor and former Chairman (2007–2013) of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey. Before joining Rutgers, he was a Senior Engineering Specialist with the Boeing Company and the Idaho National Engineering Laboratory. He has served as editor-in-chief, editor, associate editor, guest editor, and board member of numerous journals. He is the editor of Springer book series on reliability engineering and of World Scientific book series on industrial and systems engineering and has been the conference chair and program chair of over 40 international conferences. He is the author or coauthor of 6 books and has published over 170 journal articles and edited 12 books, including the Springer Handbook in Engineering Statistics and Handbook in Reliability Engineering. He has delivered over 40 invited keynote and plenary speeches at various international conferences. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award. He is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and the Institute of Industrial Engineers (IIE).
