X-ray Characterization of Materials
Eric Lifshin
2008年7月 · John Wiley & Sons
5.0star
1 条评价report
电子书
277
页
report评分和评价未经验证 了解详情
关于此电子书
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials.
The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
评分和评价
5.0
1 条评价
作者简介
Eric Lifshin is the editor of X-ray Characterization of Materials, published by Wiley.
为此电子书评分
欢迎向我们提供反馈意见。
如何阅读
智能手机和平板电脑
笔记本电脑和台式机
您可以使用计算机的网络浏览器聆听您在 Google Play 购买的有声读物。
电子阅读器和其他设备
如果要在 Kobo 电子阅读器等电子墨水屏设备上阅读，您需要下载一个文件，并将其传输到相应设备上。若要将文件传输到受支持的电子阅读器上，请按帮助中心内的详细说明操作。
