X-ray Characterization of Materials
Eric Lifshin
2008年7月 · John Wiley & Sons
5.0star
1 則評論report
電子書
277
頁數
report評分和評論未經驗證 瞭解詳情
關於這本電子書
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials.
The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.
評分和評論
5.0
1 則評論
關於作者
Eric Lifshin is the editor of X-ray Characterization of Materials, published by Wiley.
為這本電子書評分
請分享你的寶貴意見。
閱讀資訊
智能手機和平板電腦
手提電腦和電腦
你可以使用電腦的網絡瀏覽器聆聽在 Google Play 上購買的有聲書。
電子書閱讀器及其他裝置
如要在 Kobo 等電子墨水裝置上閱覽書籍，你需要下載檔案並傳輸到你的裝置。請按照說明中心的詳細指示，將檔案傳輸到支援的電子書閱讀器。
