Toh-Ming Lu

Toh-Ming attended Rensselaer Polytechnic Institute,Troy, New York.

Ebooks

Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability

Evolution of Thin Film Morphology: Modeling and Simulations

Chemical Vapor Deposition Polymerization: The Growth and Properties of Parylene Thin Films

RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis

Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms